benikigai/plus-onePublic

Plus One

Prototype in design. Every value is a design target.

Factory · Quality

Quality

How is every unit checked, and against what limits?

5
inspection plans
15
tests
10 of 15
tests with limits
Inspection plans by stage and tests, counted per station. Darker: more checks.

Inspection plans

StageCharacteristicItemStationSamplingAQLSampleMethod
IQCDiameter, ring slot width, cosmetic grade A
insp:shell-iqc
Top shellTop shell sub-assemblyANSI/ASQ Z1.4 level II
lots 1201 to 3200
proposed plan; set at the pilot build
InferredEngineering judgement, not measured. Low confidence.Evidence: src:design-brief
1125caliper, pin gauge, light booth
InferredEngineering judgement, not measured. Low confidence.Evidence: src:design-briefproposed
IQCEMS test record present; boots and enumerates over USB
insp:pcba-iqc
Main board (PCBA)Place main boardANSI/ASQ Z1.4 level S-3
lots 1201 to 3200
proposed plan; set at the pilot build
InferredEngineering judgement, not measured. Low confidence.Evidence: src:design-brief
0.6532sample power-on
InferredEngineering judgement, not measured. Low confidence.Evidence: src:design-briefproposed
IQCOpen-circuit voltage 3.7 to 3.9 V; no swelling
insp:cell-iqc
Li-ion cell with protectionBatteryANSI/ASQ Z1.4 level II
lots 501 to 1200
proposed plan; set at the pilot build
InferredEngineering judgement, not measured. Low confidence.Evidence: src:design-brief
0.480OCV meter, thickness gauge
InferredEngineering judgement, not measured. Low confidence.Evidence: src:design-briefproposed
IPQCStake pull-off force
insp:stake-ipqc
Light-ring diffuserTop shell sub-assemblyother
proposed plan; set at the pilot build
InferredEngineering judgement, not measured. Low confidence.Evidence: src:design-brief
—5push-out test, first five each shift
InferredEngineering judgement, not measured. Low confidence.Evidence: src:design-briefproposed
OQCPacked unit complete; boots; QR reads
insp:oqc-audit
Packed unit with cable and card; no back shipsFunctional test, mark, packANSI/ASQ Z1.4 level II
lots 1201 to 3200
proposed plan; set at the pilot build
InferredEngineering judgement, not measured. Low confidence.Evidence: src:design-brief
0.65125audit
InferredEngineering judgement, not measured. Low confidence.Evidence: src:design-briefproposed

Tests

TestStationMeasuresLower limitUpper limit
Firmware image flashed and verified
test:flash-verify
Flash, provision, calibrateimage hashnonenone
Unit ID provisioned once
test:unit-id
Flash, provision, calibrateeFuse read-backnonenone
Mic sensitivity after calibration
test:mic-sensitivity
Flash, provision, calibratedBFS at 94 dB SPL, 1 kHz-28 dBFS
InferredEngineering judgement, not measured. Low confidence.Evidence: src:design-briefproposed limit
-24 dBFS
InferredEngineering judgement, not measured. Low confidence.Evidence: src:design-briefproposed limit
Motion sensor bias after calibration
test:imu-bias
Flash, provision, calibrateaccelerometer biasnone0.05 g
InferredEngineering judgement, not measured. Low confidence.Evidence: src:design-briefproposed limit
Plus button actuation
test:button
Functional test, mark, packswitch closes, debouncednonenone
Touch ring delta
test:touch-ring
Functional test, mark, packtouch counts on a reference finger30%
InferredEngineering judgement, not measured. Low confidence.Evidence: src:design-briefproposed limit
none
Light ring colours
test:ring-leds
Functional test, mark, packcamera colour check per LEDnonenone
Haptic drive current
test:haptic
Functional test, mark, packmA at rated drive40 mA
InferredEngineering judgement, not measured. Low confidence.Evidence: src:design-briefproposed limit
90 mA
InferredEngineering judgement, not measured. Low confidence.Evidence: src:design-briefproposed limit
Charge current over USB-C
test:charge
Functional test, mark, packmA from USB at 5 V100 mA
InferredEngineering judgement, not measured. Low confidence.Evidence: src:design-briefproposed limit
300 mA
InferredEngineering judgement, not measured. Low confidence.Evidence: src:design-briefproposed limit
Wireless charging
test:wireless-charge
Functional test, mark, packcharge current on a reference magnetic charger60 mA
InferredEngineering judgement, not measured. Low confidence.Evidence: src:design-briefproposed limit
none
Audio loopback
test:audio-loopback
Functional test, mark, packspeaker to mics, level and THDnone3%
InferredEngineering judgement, not measured. Low confidence.Evidence: src:design-briefproposed limit
Radio check
test:rf-check
Functional test, mark, packWi-Fi and BLE RSSI against a golden radio in the shield box-60 dBm
InferredEngineering judgement, not measured. Low confidence.Evidence: src:design-briefproposed limit
none
Hardware power-off current
test:power-off
Functional test, mark, packcell current with the switch offnone1 uA
InferredEngineering judgement, not measured. Low confidence.Evidence: src:design-briefproposed limit
Pogo pad current limit
test:pogo-limit
Functional test, mark, packshort-circuit current at the padsnone300 mA
InferredEngineering judgement, not measured. Low confidence.Evidence: src:design-briefproposed limit
QR reads back
test:qr-read
Functional test, mark, packscanner readnonenone